• 文献标题:   What Does Annealing Do to Metal-Graphene Contacts?
  • 文献类型:   Article
  • 作  者:   LEONG WS, NAI CT, THONG JTL
  • 作者关键词:   graphene, annealing, contact resistance, resist residue, soft shadowmask, raman analysi
  • 出版物名称:   NANO LETTERS
  • ISSN:   1530-6984 EI 1530-6992
  • 通讯作者地址:   Natl Univ Singapore
  • 被引频次:   74
  • DOI:   10.1021/nl500999r
  • 出版年:   2014

▎ 摘  要

Annealing is a postprocessing treatment commonly used to improve metal-graphene contacts with the assumption that resist residues sandwiched at the metal-graphene contacts are removed during annealing. Here, we examine this assumption by undertaking a systematic study to understand mechanisms that lead to the contact enhancement brought about by annealing. Using a soft shadow-mask, we fabricated residue-free metal-graphene contacts with the same dimensions as lithographically defined metal-graphene contacts on the same graphene flake. Both cases show comparable contact enhancement for nickel-graphene contacts after annealing treatment signifying that removal of resist residues is not the main factor for contact enhancement. It is found instead that carbon dissolves from graphene into the metal at chemisorbed Ni- and Co-graphene interfaces and leads to many end-contacts being formed between the metal and the dangling carbon bonds in the graphene, which contributes to much smaller contact resistance.