• 文献标题:   Layer-by-Layer Transfer of Multiple, Large Area Sheets of Graphene Grown in Multilayer Stacks on a Single SiC Wafer
  • 文献类型:   Article
  • 作  者:   UNARUNOTAI S, KOEPKE JC, TSAI CL, DU F, CHIALVO CE, MURATA Y, HAASCH R, PETROV I, MASON N, SHIM M, LYDING J, ROGERS JA
  • 作者关键词:   graphene, silicon carbide, epitaxial growth, transfer technique, layerbylayer, fourpoint measurement
  • 出版物名称:   ACS NANO
  • ISSN:   1936-0851
  • 通讯作者地址:   Univ Illinois
  • 被引频次:   49
  • DOI:   10.1021/nn101896a
  • 出版年:   2010

▎ 摘  要

Here we report a technique for transferring graphene layers, one by one, from a multilayer deposit formed by epitaxial growth on the Si-terminated face of a 6H-SiC substrate. The procedure uses a bilayer film of palladium/polyimide deposited onto the graphene coated SIC, which is then mechanically peeled away and placed on a target substrate. Orthogonal etching of the palladium and polyimide leaves isolated sheets of graphene with sizes of square centimeters. Repeating these steps transfers additional sheets from the same SIC substrate. Raman spectroscopy, scanning tunneling spectroscopy, low-energy electron diffraction and X-ray photoelectron spectroscopy, together with scanning tunneling, atomic force, optical, and scanning electron microscopy reveal key properties of the materials. The sheet resistances determined from measurements of four point probe devices were found to be similar to 2 k Omega/square, close to expectation. Graphene crossbar structures fabricated in stacked configurations demonstrate the versatility of the procedures.