• 文献标题:   A Literature Review on Next Generation Graphene Interconnects
  • 文献类型:   Review
  • 作  者:   PATEL N, AGRAWAL Y
  • 作者关键词:   dsm, electromigration, integrated circuit, interconnect, nanotechnology, propagation delay, vlsi
  • 出版物名称:   JOURNAL OF CIRCUITS SYSTEMS COMPUTERS
  • ISSN:   0218-1266 EI 1793-6454
  • 通讯作者地址:   DA IICT
  • 被引频次:   2
  • DOI:   10.1142/S0218126619300083
  • 出版年:   2019

▎ 摘  要

The state-of-the-art development and subsequent miniaturization of technologies in e-systems such as computers and digital communication systems have led to densely and compactly placement of devices and interconnects in ICs. The incessant advancements of technologies have necessitated a rapid increase in operating frequencies. At nanometer dimensions and advanced technology nodes, the performance of the overall VLSI system is critically dominated by on-chip interconnects. Interconnects perpetuate several nonideal effects such as signal delay, power dissipation and cross-talk that limit the overall system performance. Owing to graving effect of interconnects on the performance parameters in ICs, research into interconnects has become meticulously very active in recent years, and concurrently much progress has been made. In this review paper, a literature review and contemporary advancements on conventional aluminum, copper and subsequent next generation graphene interconnects have been systematically presented.