• 文献标题:   In Situ Characterization of Alloy Catalysts for Low-Temperature Graphene Growth
  • 文献类型:   Article
  • 作  者:   WEATHERUP RS, BAYER BC, BLUME R, DUCATI C, BAEHTZ C, SCHLOGL R, HOFMANN S
  • 作者关键词:   graphene, chemical vapor deposition cvd, alloy catalyst, in situ metrology, xps, xrd
  • 出版物名称:   NANO LETTERS
  • ISSN:   1530-6984 EI 1530-6992
  • 通讯作者地址:   Univ Cambridge
  • 被引频次:   182
  • DOI:   10.1021/nl202036y
  • 出版年:   2011

▎ 摘  要

Low-temperature (similar to 450 degrees C), scalable chemical vapor deposition of predominantly monolayer (74%) graphene films with an average D/G peak ratio of 0.24 and domain sizes in excess of 220 mu m(2) is demonstrated via the design of alloy catalysts. The admixture of Au to polycrystalline Ni allows a controlled decrease in graphene nucleation density, highlighting the role of step edges. In situ, time-, and depth-resolved X-ray photoelectron spectroscopy and X-ray diffraction reveal the role of subsurface C species and allow a coherent model for graphene formation to be devised.