• 文献标题:   Hysteresis of In Situ CCVD Grown Graphene Transistors
  • 文献类型:   Article
  • 作  者:   WESSELY PJ, WESSELY F, BIRINCI E, RIEDINGER B, SCHWALKE U
  • 作者关键词:  
  • 出版物名称:   ELECTROCHEMICAL SOLID STATE LETTERS
  • ISSN:   1099-0062 EI 1944-8775
  • 通讯作者地址:   Tech Univ Darmstadt
  • 被引频次:   13
  • DOI:   10.1149/2.019204esl
  • 出版年:   2012

▎ 摘  要

In this paper we report on a novel method to fabricate graphene transistors directly on oxidized silicon wafers without the need to transfer graphene. By means of catalytic chemical vapor deposition (CCVD) the in situ grown monolayer graphene field-effect transistors (MoLGFETs) and bilayer graphene field-effect transistors (BiLGFETs) are realized directly on oxidized silicon substrate. In situ CCVD grown BiLGFETs possess unipolar p-type device characteristics with an extremely high on/off-current ratio up to 1 x 10(7). With this novel fabrication method hundreds of large scale in situ CCVD grown graphene FETs are realized simultaneously on one 2 '' wafer in a silicon CMOS compatible process. (C) 2012 The Electrochemical Society. [DOI: 10.1149/2.019204esl] All rights reserved.