• 文献标题:   Line defect induced conductance suppression in graphene nanojunction
  • 文献类型:   Article
  • 作  者:   LI HD, LI RX, YU QY, KANG XB, DING J
  • 作者关键词:   graphene, line defect, staggered potential, conductance suppression
  • 出版物名称:   SOLID STATE COMMUNICATIONS
  • ISSN:   0038-1098 EI 1879-2766
  • 通讯作者地址:   Henan Inst Engn
  • 被引频次:   1
  • DOI:   10.1016/j.ssc.2016.02.009
  • 出版年:   2016

▎ 摘  要

Line defect induced conductance suppression in graphene nanojunction is investigated by means of Landauer-Butikker formula and the nonequilibrium Green's function technique. With the increase of the longitudinal size of the device region, the conductance value decreases and tends to form two conductance valleys. Then we prove that the line defect can lead to localize states in the device region, which contributes to conductance valley at the point far away from Dirac point. And the zero conductance at the Dirac point is associated with the edge state localized at the zigzag-edged shoulder of the nanojunctions. The staggered potential can change energy spectrum structure of the device region, and produce strong conductance suppression. The line defect can efficiently enhance the conductance suppression, which can be utilized to realize the electron transport manipulation. (C) 2016 Elsevier Ltd. All rights reserved.