• 文献标题:   Electrical characterization of graphene oxide and organic dielectric layers based on thin film transistor
  • 文献类型:   Article, Proceedings Paper
  • 作  者:   KARTERI I, KARATAS S, YAKUPHANOGLU F
  • 作者关键词:   graphene oxide, modified hummers method, thin film transistor
  • 出版物名称:   APPLIED SURFACE SCIENCE
  • ISSN:   0169-4332 EI 1873-5584
  • 通讯作者地址:   Kahramanmaras Sutcu Imam Univ
  • 被引频次:   21
  • DOI:   10.1016/j.apsusc.2014.01.013
  • 出版年:   2014

▎ 摘  要

We have studied the electrical characteristics of graphene oxide based thin flim transistor with the polymer insulators such as polymethyl methacrylate (PMMA) and poly-4-vinylphenol (PVP). Graphene oxide (GO) nanosheets were prepared by using modified Hummers method. The structural properties of GO nanosheets were characterized with Ultraviolet Visible (UV-vis), FT-IR spectroscopy and X-rays diffraction (XRD). Graphene oxide based thin flim transistor (GO-TFT) was prepared by a spin-coating and thermal evaporation technique. The electrical characterization of GO-TFT was analyzed by output and transfer characteristics by using Keithley-4200 semiconductor characterization system (SCS). The graphene oxide based thin flim transistor devices show p-type semiconducting behavior. The mobility, threshold voltage, sub-threshold swing value and I-on/I-off of GO-TFT were found to be 0.105 cm(2) V-1 s(-1), -8.7V, 4.03 V/decade and 10, respectively. (C) 2014 Elsevier B.V. All rights reserved.