• 文献标题:   Estimation of residual carrier density near the Dirac point in graphene through quantum capacitance measurement
  • 文献类型:   Article
  • 作  者:   NAGASHIO K, NISHIMURA T, TORIUMI A
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951 EI 1077-3118
  • 通讯作者地址:   Univ Tokyo
  • 被引频次:   28
  • DOI:   10.1063/1.4804430
  • 出版年:   2013

▎ 摘  要

We discuss the residual carrier density (n*) near the Dirac point (DP) in graphene estimated by quantum capacitance (C-Q) and conductivity (sigma) measurements. The C-Q at the DP has a finite value and is independent of the temperature. A similar behavior is also observed for the conductivity at the DP, because their origin is residual carriers induced externally by charged impurities. The n* extracted from C-Q, however, is often smaller than that from sigma, suggesting that the mobility in the puddle region is lower than that in the linear region. The C-Q measurement should be employed for estimating n* quantitatively. (C) 2013 AIP Publishing LLC.