▎ 摘　　要

Epitaxial graphene on silicon carbide labeled 6H-SiC (0001) substrate has been patterned using high resolution focused ion beam. Atomic force microscopy and Raman spectroscopy measurements give evidence of the strong resilience of the graphene monolayer to ion irradiation. The morphology and electronic properties of defects versus ion doses exhibit a progressive local amorphization of graphene. (C) 2011 American Institute of Physics. [doi:10.1063/1.3628341]