• 文献标题:   Few-layer graphene under high pressure: Raman and X-ray diffraction studies
  • 文献类型:   Article
  • 作  者:   CLARK SM, JEON KJ, CHEN JY, YOO CS
  • 作者关键词:   graphene, xray diffraction, raman spectroscopy, synchrotron radiation, highpressure
  • 出版物名称:   SOLID STATE COMMUNICATIONS
  • ISSN:   0038-1098 EI 1879-2766
  • 通讯作者地址:   Macquarie Univ
  • 被引频次:   48
  • DOI:   10.1016/j.ssc.2012.10.002
  • 出版年:   2013

▎ 摘  要

The effect of pressure on the structure of few-layer graphene has been investigated to 50 GPa in both quasi-hydrostatic and non-hydrostatic conditions, using X-ray diffraction and Raman spectroscopy. The results indicate that few-layer graphene loses its long-range order at the critical interlayer distance of similar to 2.8 angstrom (or above similar to 18 GPa), while maintaining the local sp(2) hybridization in the layer to 50 GPa. This suggests that graphene not only has the highest stability of all graphitic layer structures, but also becomes one of the most healable structures under large stress. (C) 2012 Published by Elsevier Ltd.