• 文献标题:   Shot noise in ballistic graphene
  • 文献类型:   Article
  • 作  者:   DANNEAU R, WU F, CRACIUN MF, RUSSO S, TOMI MY, SALMILEHTO J, MORPURGO AF, HAKONEN PJ
  • 作者关键词:  
  • 出版物名称:   PHYSICAL REVIEW LETTERS
  • ISSN:   0031-9007
  • 通讯作者地址:   Helsinki Univ Technol
  • 被引频次:   165
  • DOI:   10.1103/PhysRevLett.100.196802
  • 出版年:   2008

▎ 摘  要

We have investigated shot noise in graphene field effect devices in the temperature range of 4.2-30 K at low frequency (f=600-850 MHz). We find that for our graphene samples with a large width over length ratio W/L, the Fano factor F reaches a maximum F similar to 1/3 at the Dirac point and that it decreases strongly with increasing charge density. For smaller W/L, the Fano factor at Dirac point is significantly lower. Our results are in good agreement with the theory describing that transport at the Dirac point in clean graphene arises from evanescent electronic states.