• 文献标题:   Sensing layer combination of vertically aligned ZnO nanorods and graphene oxide for ultrahigh sensitivity IDE capacitive humidity sensor
  • 文献类型:   Article
  • 作  者:   PONGAMPAI S, PENGPAD P, MEANANEATRA R, CHAISRIRATANAKUL W, POYAI A, HORPRATHUM M, CHANANONNAWATHORN C, TITIROONGRUANG W, MUANGHLUA R
  • 作者关键词:   humidity sensor, sensing layer combination slc, zno nanorod, graphene oxide, ultrahigh sensitivity
  • 出版物名称:   IEEJ TRANSACTIONS ON ELECTRICAL ELECTRONIC ENGINEERING
  • ISSN:   1931-4973 EI 1931-4981
  • 通讯作者地址:   King Mongkuts Inst Technol Ladkrabang
  • 被引频次:   0
  • DOI:   10.1002/tee.23140 EA APR 2020
  • 出版年:   2020

▎ 摘  要

An interdigitated electrode (IDE) capacitive humidity sensor fabricated on a silicon substrate was used to investigate sensing materials, which proved to be an ultrahigh-sensitivity humidity sensor. A sensing layer combination (SLC) between vertically aligned ZnO nanorods and optimal graphene oxide (GO) was prepared on the device and was tested as a humidity sensor. X-ray diffractometry (XRD) exhibited crystallized wurtzite structure of ZnO nanorods and transmission electron microscope (TEM) shown perfectly indexed hexagonal wurtzite ZnO structure dots position correspondence. A scanning electron microscope (SEM) was used to analyze ZnO nanorods/GO morphologies. Furthermore, Raman spectroscopy and X-ray photoelectron spectroscopy (XPS) clearly exhibited GO presence and hydrophilic functional groups (carboxyl, epoxy, and hydroxyl), respectively. The SLC prominently demonstrated ultrahigh sensitivity (up to 196.95% or 1.97 times from commercial sensor; HS1101, Humirel) and linear responses behavior with 0.96 for coefficient of determination. The device sensitivity obviously improved as steps of 40, 50, 60, 70, 80, and 90% RH at values of 1.09, 1.41, 1.51, 1.65, 1.80, and 1.91 times, respectively. The device also exhibited fast response (25 s) and short recovery times (17 s). Its hysteresis (6.58%) manifestly improved to 1.84 times. Moreover, repeatability and long-term ability of the device demonstrated high accuracy (range +/- 0.37pF) and durability. (c) 2020 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.