• 文献标题:   On Dielectric Screening in Twisted Double Bilayer Graphene
  • 文献类型:   Article
  • 作  者:   MUKAI F, HORII K, HATA N, EBISUOKA R, WATANABE K, TANIGUCHI T, YAGI R
  • 作者关键词:  
  • 出版物名称:   JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN
  • ISSN:   0031-9015
  • 通讯作者地址:  
  • 被引频次:   1
  • DOI:   10.7566/JPSJ.90.124702
  • 出版年:   2021

▎ 摘  要

We have studied the dielectric screening of electric field which is induced by a gate voltage in twisted double bilayer graphene by using a sample with a mismatch angle of about 5 degrees. In low temperature magnetotransport measurements, quantum oscillations of magnetoresistance originating from two bands with different carrier density were observed. The behavior of the carrier densities with respect to the total carrier density was distinct from that of the AB-stacked tetralayer graphene. The carrier density ratio was theoretically analyzed in terms of the model that the induced charge decays exponentially with distance with a screening length lambda. The estimated lambda was slightly larger than that of AB-stacked graphene, which would possibly reflect the difference in the inter-plane distribution of probability of the wave function.