• 文献标题:   On the roughness of single- and bi-layer graphene membranes
  • 文献类型:   Article
  • 作  者:   MEYER JC, GEIM AK, KATSNELSON MI, NOVOSELOV KS, OBERGFELL D, ROTH S, GIRIT C, ZETTL A
  • 作者关键词:   thin film, nanofabrication, transmission electron microscopy, mechanical propertie
  • 出版物名称:   SOLID STATE COMMUNICATIONS
  • ISSN:   0038-1098 EI 1879-2766
  • 通讯作者地址:   Univ Calif Berkeley
  • 被引频次:   366
  • DOI:   10.1016/j.ssc.2007.02.047
  • 出版年:   2007

▎ 摘  要

We present a detailed transmission electron microscopy and electron diffraction study of the thinnest possible membrane, a single layer of carbon atoms suspended in vacuum and attached only at its edges. Membranes consisting of two graphene layers are also reported. We find that the membranes exhibit random microscopic curvature that is strongest in single-layer membranes. A direct visualization of the roughness is presented for two-layer membranes where we used the variation of diffracted intensities with the local orientation of the membrane. (c) 2007 Elsevier Ltd. All rights reserved.