• 文献标题:   Atomistic simulations of the implantation of low-energy boron and nitrogen ions into graphene
  • 文献类型:   Article
  • 作  者:   AHLGREN EH, KOTAKOSKI J, KRASHENINNIKOV AV
  • 作者关键词:  
  • 出版物名称:   PHYSICAL REVIEW B
  • ISSN:   2469-9950 EI 2469-9969
  • 通讯作者地址:   Univ Helsinki
  • 被引频次:   92
  • DOI:   10.1103/PhysRevB.83.115424
  • 出版年:   2011

▎ 摘  要

By combining classical molecular dynamics simulations and density-functional-theory total-energy calculations, we study the possibility of doping graphene with B and N atoms using low-energy ion irradiation. Our simulations show that the optimum irradiation energy is 50 eV with substitution probabilities of 55% for N and 40% for B. We further estimate probabilities for different defect configurations to appear under B and N ion irradiation. We analyze the processes responsible for defect production and report an effective swift chemical sputtering mechanism for N irradiation at low energies (similar to 125 eV), which leads to production of single vacancies. Our results show that ion irradiation is a promising method for creating hybrid C-B/N structures for future applications in the realm of nanoelectronics.