• 文献标题:   Microfocus infrared ellipsometry characterization of air-exposed graphene flakes
  • 文献类型:   Article
  • 作  者:   WEBER JW, HINRICHS K, GENSCH M, VAN DE SANDEN MCM, OATES TWH
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951
  • 通讯作者地址:   Eindhoven Univ Technol
  • 被引频次:   11
  • DOI:   10.1063/1.3624826
  • 出版年:   2011

▎ 摘  要

Graphene and ultrathin graphite flakes prepared by exfoliation were characterized by microfocus synchrotron infrared mapping ellipsometry. The dielectric function of graphene in a dry-air atmosphere is determined and compared to that of ultrathin graphite, bulk graphite, and gold. The imaginary part of graphene is revealed to be about an order of magnitude higher than that of graphite and comparable to that of gold. Comparing the conductivity to an optical model considering intraband transitions, we discuss the critical effects of environmental exposure, relevant for real-world applications. (C) 2011 American Institute of Physics. [doi:10.1063/1.3624826]