• 文献标题:   Recent progress of graphene orientation determination technology based on scanning probe microscopy
  • 文献类型:   Article
  • 作  者:   ZHANG Y, LIU GJ, XU WJ
  • 作者关键词:  
  • 出版物名称:   MICRO NANO LETTERS
  • ISSN:  
  • 通讯作者地址:   Changchun Normal Univ
  • 被引频次:   0
  • DOI:   10.1049/mnl.2019.0782
  • 出版年:   2020

▎ 摘  要

Graphene is regarded as an excellent substitute for silicon and an ideal chip material for the next generation of chip manufacturing. Researches show that the electrical properties of graphene are closely related to its edge structures. Graphene can exhibit metal or semiconductive characteristics according to the different edge configurations. How to fabricate graphene nanoribbons with specific edge structures is the key premise for practical applications. The review highlights the new graphene crystal orientation detection methods based on scanning probe technology, including offline detection technology and online detection technology. The advantages and disadvantages of different detection technologies are analysed, and finally, a brief outlook for the development of graphene orientation determination techniques is given.