• 文献标题:   Exploring electronic structure of one-atom thick polycrystalline graphene films: A nano angle resolved photoemission study
  • 文献类型:   Article
  • 作  者:   AVILA J, RAZADO I, LORCY S, FLEURIER R, PICHONAT E, VIGNAUD D, WALLART X, ASENSIO MC
  • 作者关键词:  
  • 出版物名称:   SCIENTIFIC REPORTS
  • ISSN:   2045-2322
  • 通讯作者地址:   Synchrotron SOLEIL
  • 被引频次:   55
  • DOI:   10.1038/srep02439
  • 出版年:   2013

▎ 摘  要

The ability to produce large, continuous and defect free films of graphene is presently a major challenge for multiple applications. Even though the scalability of graphene films is closely associated to a manifest polycrystalline character, only a few numbers of experiments have explored so far the electronic structure down to single graphene grains. Here we report a high resolution angle and lateral resolved photoelectron spectroscopy (nano-ARPES) study of one-atom thick graphene films on thin copper foils synthesized by chemical vapor deposition. Our results show the robustness of the Dirac relativistic-like electronic spectrum as a function of the size, shape and orientation of the single-crystal pristine grains in the graphene films investigated. Moreover, by mapping grain by grain the electronic dynamics of this unique Dirac system, we show that the single-grain gap-size is 80% smaller than the multi-grain gap recently reported by classical ARPES.