• 文献标题:   RF Linearity Performance Potential of Short-Channel Graphene Field-Effect Transistors
  • 文献类型:   Article
  • 作  者:   UL ALAM A, HOLLAND KD, WONG M, AHMED S, KIENLE D, VAIDYANATHAN M
  • 作者关键词:   contact resistance, device modeling, device physic, fet devices circuit, fet modeling, gfet, graphene, graphene transistor, harmonic balance, intermodulation distortion, linearity, nanoelectronic, nonlinear device modeling, radiofrequency performance, solid state device, thirdorder inputintercept point, transistor modeling
  • 出版物名称:   IEEE TRANSACTIONS ON MICROWAVE THEORY TECHNIQUES
  • ISSN:   0018-9480 EI 1557-9670
  • 通讯作者地址:   Univ Alberta
  • 被引频次:   4
  • DOI:   10.1109/TMTT.2015.2496295
  • 出版年:   2015

▎ 摘  要

The radio-frequency (RF) linearity performance potential of short-channel graphene field-effect transistors (GFETs) is assessed by using a nonlinear small-signal circuit model under the first approximation of ballistic transport. An intrinsic GFET is examined to reveal the key features of GFET linearity, and extrinsic parasitics are then included to assess the overall RF linearity. It is shown that short-channel GFETs can be expected to have a signature behavior versus gate bias that includes a constant-linearity region at low gate bias, sweet spots of high linearity before and after the gate bias for peak cutoff frequency, and poor linearity at the gate bias corresponding to the peak cutoff frequency. It is otherwise found that a GFET offers overall linearity that is comparable to a MOSFET and a CNFET, with the exception that the amount of intermodulation distortion in a GFET is dominated by the drain-injected carriers, a unique outcome of graphene's lack of a bandgap. Qualitative agreement with experiment in the signature behavior of GFET linearity supports the approach and conclusions.