▎ 摘　　要

We present a symmetry analysis of allowed infrared and Raman modes in graphene and highly oriented pyrolytic graphite. Surface structure for highly oriented pyrolytic graphite is examined using atomic force microscopy. As experimental tools, we used infrared spectroscopic ellipsometry in order to investigate the pseudodielectric function of highly oriented pyrolytic graphite in the mid-infrared range (500-7000 cm(-1)) and Raman spectroscopy to investigate the influence of layers number decrease. As a result, we propose a method for an experimental verification of graphene.