• 文献标题:   Stacking-Dependent Electronic Structure of Trilayer Graphene Resolved by Nanospot Angle-Resolved Photoemission Spectroscopy
  • 文献类型:   Article
  • 作  者:   BAO CH, YAO W, WANG EY, CHEN CY, AVILA J, ASENSIO MC, ZHOU SY
  • 作者关键词:   nanoarpes, trilayer graphene, rhombohedral abc stacking, aaa stacking flat band
  • 出版物名称:   NANO LETTERS
  • ISSN:   1530-6984 EI 1530-6992
  • 通讯作者地址:   Tsinghua Univ
  • 被引频次:   19
  • DOI:   10.1021/acs.nanolett.6b04698
  • 出版年:   2017

▎ 摘  要

The crystallographic stacking order in multilayer graphene plays an important role in determining its electronic structure. In trilayer graphene, rhombohedral stacking (ABC) is particularly intriguing, exhibiting a flat band with an electric-field tunable band gap. Such electronic structure is distinct from simple hexagonal stacking (AAA) or typical Bernal stacking (ABA) and is promising for nanoscale electronics and optoelectronics applications. So far clean experimental electronic spectra on the first two stackings are missing because the samples are usually too small in size (mu m or nm scale) to be resolved by conventional angle-resolved photo emission spectroscopy (ARPES). Here, by using ARPES with a nanospot beam size (NanoARPES), we provide direct experimental evidence for the coexistence of three different stackings of trilayer graphene and reveal their distinctive electronic structures directly. By fitting the experimental data, we provide important experimental band parameters for describing the electronic structure of trilayer graphene with different stackings