• 文献标题:   Structural and Electronic Properties of PTCDA Thin Films on Epitaxial Graphene
  • 文献类型:   Article
  • 作  者:   HUANG H, CHEN S, GAO XY, CHEN W, WEE ATS
  • 作者关键词:   epitaxial graphene, silicon carbide, ptcda, scanning tunneling microscopy, photoemission spectroscopy
  • 出版物名称:   ACS NANO
  • ISSN:   1936-0851 EI 1936-086X
  • 通讯作者地址:   Natl Univ Singapore
  • 被引频次:   138
  • DOI:   10.1021/nn9008615
  • 出版年:   2009

▎ 摘  要

In situ low-temperature scanning tunneling microscopy is used to study the growth of 3,4,9,10-perylene tetracarboxylic dianhydride (PTCDA) on epitaxial graphene (EG) on 6H-SiC(0001), as well as on HOPG for comparison. PTCDA adopts a layer-by-layer growth mode, with its molecular plane lying flat on both surfaces. The PTCDA films grow continuously over the EG step edges, but not on HOPG. STS performed on single-layer PTCDA on monolayer EG shows a wide band gap larger than 3.3 eV, consistent with pristine PTCDA films. Synchrotron-based high-resolution photoemission spectroscopy reveals weak charge transfer between PTCDA and EG. This suggests weak electronic coupling between PTCDA and the underlying EG layer.