• 文献标题:   The impact of substrate selection for the controlled growth of graphene by molecular beam epitaxy
  • 文献类型:   Article, Proceedings Paper
  • 作  者:   SCHUMANN T, LOPES JMJ, WOFFORD JM, OLIVEIRA MH, DUBSLAFF M, HANKE M, JAHN U, GEELHAAR L, RIECHERT H
  • 作者关键词:   surface, xray diffraction, molecular beam epitaxy, nanomaterial
  • 出版物名称:   JOURNAL OF CRYSTAL GROWTH
  • ISSN:   0022-0248 EI 1873-5002
  • 通讯作者地址:   Paul Drude Inst Festkorperelekt
  • 被引频次:   5
  • DOI:   10.1016/j.jcrysgro.2015.02.060
  • 出版年:   2015

▎ 摘  要

We examine how substrate selection impacts the resulting film properties in graphene growth by molecular beam epitaxy (MBE). Graphene growth on metallic as well as dielectric templates was investigated. We find that MBE offers control over the number of atomic graphene layers regardless of the substrate used High structural quality could be achieved for graphene prepared on Ni (111) films which were epitaxially grown on MgO (111). For growth either on Al2O3 (0001) or on (6 root 3 x 6 root 3)R30 degrees - reconstructed SiC (0001) surfaces, graphene with a higher density of defects is obtained. Interestingly, despite their defective nature, the layers possess a well defined epitaxial relation to the underlying substrate. These results demonstrate the feasibility of MBE as a technique for realizing the scalable synthesis of this two-dimensional crystal on a variety of substrates. (C) 2015 Elsevier B.V. All rights reserved,