▎ 摘　　要

Graphene oxide (GO) foils were modified by irradiation using 1.0 MeV Au+ ions, and their elemental composition before and after the ion irradiation was investigated using Rutherford back-scattering spectroscopy (RBS). The surface morphology was studied using SEM, and changes in elemental composition and structure of GO in shallow subsurface were characterized by various spectroscopy techniques including X-ray photoelectron spectroscopy and Raman spectroscopy. Electrical properties were determined using standard 2-point method. The analyses indicate that the Au irradiation up to 1.0 x 10(15) cm(-1) results in removal of oxygen functionalities and growth of graphene domains, leading to a surface conductivity increase dependent on the applied ion fluence. The Au irradiation with excessive ion fluencies leads to the amorphization of GO foil structure.