• 文献标题:   Angular reflectance of graphene/SiO2/Si in UV spectral range: A study for potential applications
  • 文献类型:   Article
  • 作  者:   ZUPPELLA P, GERLIN F, PELIZZO MG
  • 作者关键词:   optical material, thin film, optical propertie, thin films devices application
  • 出版物名称:   OPTICAL MATERIALS
  • ISSN:   0925-3467 EI 1873-1252
  • 通讯作者地址:   CNR
  • 被引频次:   0
  • DOI:   10.1016/j.optmat.2017.03.042
  • 出版年:   2017

▎ 摘  要

The optical performances of graphene have been already studied in the visible and infrared spectral regions in terms of protection and antireflection properties. In the ultraviolet range, the reflectance properties have been only partially investigated at the normal incidence configuration. On the other hand, graphene optical response at ultraviolet wavelengths is challenging due to the absorption increase, the Van Hove regions and the excitons effects. Thus, the determination of the optical constants and the prediction of the performances is debated. In this paper, experimental angular reflectance investigations of SiO2/Si specimens with a monolayer graphene deposited on, are reported at different ultraviolet lines against the incidence angle. The reflectance measurements are here discussed in the context of graphene properties and physical effects at the selected lines. Optical elements based on graphene/SiO2/Si are suggested as high quality, potentially time stable reflective components. One possible application in UV-pump IR-probe arrangements is proposed in the light of the experimental and modeled results. (C) 2017 Elsevier B.V. All rights reserved.