• 文献标题:   Investigation of the Hydrogen Etching Effect of the SiC Surface on the Formation of Graphene Films
  • 文献类型:   Article
  • 作  者:   LEBEDEV SP, BARASH IS, ELISEYEV IA, DEMENTEV PA, LEBEDEV AA, BULAT PV
  • 作者关键词:  
  • 出版物名称:   TECHNICAL PHYSICS
  • ISSN:   1063-7842 EI 1090-6525
  • 通讯作者地址:   Ioffe Inst
  • 被引频次:   1
  • DOI:   10.1134/S1063784219120144
  • 出版年:   2019

▎ 摘  要

We have studied the effect of temperature and etching duration of the 4H-SiC (0001) surface in hydrogen on the structural perfection of graphene films grown by thermal destruction. Several technological modes have been identified that enable etching of the substrate without changing the stoichiometric composition of the surface. It has been demonstrated that pregrowth etching in hydrogen at T = 1600 degrees C with a duration of 1 min makes it possible to obtain a more uniform and structurally perfect graphene than etching at T = 1300 degrees C with a 30 min duration.