• 文献标题:   Carrier localization length in edge-disordered graphene nanoribbons with sub-100 nm length
  • 文献类型:   Article
  • 作  者:   TAKASHIMA K, KONABE S, YAMAMOTO T
  • 作者关键词:  
  • 出版物名称:   JOURNAL OF APPLIED PHYSICS
  • ISSN:   0021-8979 EI 1089-7550
  • 通讯作者地址:   Tokyo Univ Sci
  • 被引频次:   4
  • DOI:   10.1063/1.4939609
  • 出版年:   2016

▎ 摘  要

We theoretically and computationally examined carrier localization in semiconducting edge-disordered graphene nanoribbons (ED-GNRs) with sub-100nm lengths that correspond to the typical gate length for field-effect transistors. We numerically found that the localization length of ED-GNRs is proportional to the square of ribbon width and inversely proportional to the edge-disorder concentration. Furthermore, we obtained an analytical formula of the localization length in terms of the GNR width and the roughness concentration. (C) 2016 AIP Publishing LLC.