• 文献标题:   Electrical Double Layer Capacitance in a Graphene-embedded Al2O3 Gate Dielectric
  • 文献类型:   Article
  • 作  者:   MIN BK, KIM SK, KIM SJ, KIM SH, KANG MA, PARK CY, SONG W, MYUNG S, LIM J, AN KS
  • 作者关键词:  
  • 出版物名称:   SCIENTIFIC REPORTS
  • ISSN:   2045-2322
  • 通讯作者地址:   Korea Res Inst Chem Technol
  • 被引频次:   25
  • DOI:   10.1038/srep16001
  • 出版年:   2015

▎ 摘  要

Graphene heterostructures are of considerable interest as a new class of electronic devices with exceptional performance in a broad range of applications has been realized. Here, we propose a graphene-embedded Al2O3 gate dielectric with a relatively high dielectric constant of 15.5, which is about 2 times that of Al2O3, having a low leakage current with insertion of tri-layer graphene. In this system, the enhanced capacitance of the hybrid structure can be understood by the formation of a space charge layer at the graphene/Al2O3 interface. The electrical properties of the interface can be further explained by the electrical double layer (EDL) model dominated by the diffuse layer.