• 文献标题:   An analytical drain current model for graphene nanoribbon tunnel field-effect transistors
  • 文献类型:   Article
  • 作  者:   BAO JR, HU SY, HU GX, HU LG, LIU R, ZHENG LR
  • 作者关键词:  
  • 出版物名称:   JAPANESE JOURNAL OF APPLIED PHYSICS
  • ISSN:   0021-4922 EI 1347-4065
  • 通讯作者地址:   Fudan Univ
  • 被引频次:   0
  • DOI:   10.7567/1347-4065/ab36af
  • 出版年:   2019

▎ 摘  要

We develop a tunneling probability model based on a structure of p(+)-i-n(+) of a graphene nanoribbon (GNR) tunnel field-effect transistors (TFETs), and present an analytical drain current model based on the tunneling probability model. Model results are compared with those in the literature, and good agreements are observed. With the drain current model, the output and transfer characteristics of currents in a GNR TFET can be obtained easily and quickly. Being in an explicit form, the drain current model can be embedded in the integrated circuit design simulation tools. We observe that low temperature favors both the GNR TFET's drain current and subthreshold swing. (C) 2019 The Japan Society of Applied Physics