• 文献标题:   Field effect of in-plane gates with different gap sizes on the Fermi level tuning of graphene channels
  • 文献类型:   Article
  • 作  者:   LIN MY, CHEN YH, WANG CH, SU CF, CHANG SW, LEE SC, LIN SY
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951 EI 1077-3118
  • 通讯作者地址:   Acad Sinica
  • 被引频次:   1
  • DOI:   10.1063/1.4875583
  • 出版年:   2014

▎ 摘  要

Tuning of the Fermi level is investigated in graphene channels using two in-plane gates with significantly different-sized isolating gaps. While the n-type tuning was achievable in both schemes, the wide-gap device had an enhanced minimum drain current and less prominent current modulation than the narrow-gap device. In addition, further p-type tuning was not observed in the wide-gap device at negative gate biases. These phenomena indicated that both devices had distinct field-strength dependences and Fermi level tuning effects, which may be critical for the practical design of devices. (C) 2014 AIP Publishing LLC.