• 文献标题:   Comparing the weak and strong gate-coupling regimes for nanotube and graphene transistors
  • 文献类型:   Article
  • 作  者:   HELLER I, CHATOOR S, MANNIK J, ZEVENBERGEN MAG, DEKKER C, LEMAY SG
  • 作者关键词:  
  • 出版物名称:   PHYSICA STATUS SOLIDIRAPID RESEARCH LETTERS
  • ISSN:   1862-6254 EI 1862-6270
  • 通讯作者地址:   Delft Univ Technol
  • 被引频次:   10
  • DOI:   10.1002/pssr.200903157
  • 出版年:   2009

▎ 摘  要

We present an experimental and theoretical comparison of the weak and strong gate-coupling regimes that arise for carbon nanotube (CNT) and graphene field-effect transistors (FETs) in back-gated and liquid-gated configuration, respectively. We find that whereas the back-gate efficiency is suppressed for a liquid-gated CNT FET, the back gate is still effective in case of a liquid-gated graphene FET. We calculate the gate-induced Fermi-level shifts and induced charge densities. In both strong and weak coupling regimes, nonlinearities occur in the gate dependence of these parameters, which can significantly influence the electronic transport. (c) 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim