• 文献标题:   Robust Two-Dimensional Electronic Properties in Three-Dimensional Microstructures of Rotationally Stacked Turbostratic Graphene
  • 文献类型:   Article
  • 作  者:   RICHTER N, HERNANDEZ YR, SCHWEITZER S, KIM JS, PATRA AK, ENGLERT J, LIEBERWIRTH I, LISCIO A, PALERMO V, FENG XL, HIRSCH A, MULLEN K, KLAUI M
  • 作者关键词:  
  • 出版物名称:   PHYSICAL REVIEW APPLIED
  • ISSN:   2331-7019
  • 通讯作者地址:   Johannes Gutenberg Univ Mainz
  • 被引频次:   6
  • DOI:   10.1103/PhysRevApplied.7.024022
  • 出版年:   2017

▎ 摘  要

We report on the electronic properties of turbostratic graphitic microdisks, rotationally stacked systems of graphene layers, where interlayer twisting leads to electronic decoupling resulting in charge-transport properties that retain the two dimensionality of graphene, despite the presence of a large number of layers. A key fingerprint of this reduced dimensionality is the effect of weak charge-carrier localization that we observe at low temperatures. The disks' resistivity measured as a function of magnetic field changes its shape from parabolic at room temperature to linear at a temperature of 2.7 K indicating further this type of two-dimensional transport. Compared to Bernal stacked graphite, turbostratic graphene is mechanically much more robust, and it exhibits almost negligible variations of the electrical properties between samples. We demonstrate a reproducible resistivity of (3.52 +/- 0.11) x 10(-6) Omega m, which is a particularly low value for graphitic systems. Combined with large charge-carrier mobilities demonstrated at low temperatures of up to 7 x 10(4) cm(2)/Vs, typical for carbon-based crystalline conductors, such disks are highly interesting from a scientific point of view and, in particular, for applications where robust electronic properties are required.