• 文献标题:   Graphene Flash Memory
  • 文献类型:   Article
  • 作  者:   HONG AJ, SONG EB, YU HS, ALLEN MJ, KIM J, FOWLER JD, WASSEI JK, PARK Y, WANG Y, ZOU J, KANER RB, WEILLER BH, WANG KL
  • 作者关键词:   graphene, nonvolatile flash memory, memory window, retention time, celltocell interference
  • 出版物名称:   ACS NANO
  • ISSN:   1936-0851 EI 1936-086X
  • 通讯作者地址:   IBM Corp
  • 被引频次:   151
  • DOI:   10.1021/nn201809k
  • 出版年:   2011

▎ 摘  要

Graphene's single atomic layer of sp(2) carbon has recently garnered much attention for its potential use in electronic applications. Here, we report a memory application for graphene, which we call graphene flash memory (GFM). GFM has the podtential to exceed the performance of current flash memory technology by utilizing the intrinsic properties of graphene, such as high density of states, high work function, and low dimensionality. To this end, we have grown large-area graphene sheets by chemical vapor deposition and integrated them into a floating gate structure. GFM displays a wide memory window of similar to 6 Vat significantly low program/erase voltages of +/- 7 V. GFM also shows a long retention time of more than 10 years at room temperature. Additionally, simulations suggest that GFM suffers very little from cell-to-cell interference, potentially enabling scaling down far beyond current state-of-the-art flash memory devices.