▎ 摘　　要

A microwave detection method was applied to study weak localization in epitaxial graphene sheets grown on SiC substrates. Both coherence and scattering length values were obtained. The intervalley scattering length was found to be about one order of magnitude greater than the intravalley and warping lengths. The influence of width and amplitude of the signal on the decoherence rate was discussed. The temperature dependence and the angular dependence of the observed signal were presented. The decoherence rate was found to depend linearly on temperature, showing the electron-electron scattering mechanism, evidencing electron spin-flip scattering.