• 文献标题:   Characterizing Nitrogen Sites in Nitrogen-Doped Reduced Graphene Oxide: A Combined Solid-State N-15 NMR, XPS, and DFT Approach
  • 文献类型:   Article
  • 作  者:   KIM G, LEE J, LIU T, GREY CP
  • 作者关键词:  
  • 出版物名称:   JOURNAL OF PHYSICAL CHEMISTRY C
  • ISSN:   1932-7447 EI 1932-7455
  • 通讯作者地址:  
  • 被引频次:   7
  • DOI:   10.1021/acs.jpcc.1c02669 EA MAY 2021
  • 出版年:   2021

▎ 摘  要

Despite the potential applications in energy storage and conversion systems such as Li-oxygen batteries and fuel cells, the nature and distribution of doped nitrogen sites in reduced graphene oxides are still not well understood. In this work, we report a combined approach of N-15 solid-state nuclear magnetic resonance (NMR) spectroscopy alongside the predominantly used Xray photoelectron spectroscopy (X-PS) to characterize the nitrogen environments in reduced graphene oxides. Application of H-1-N-15 low-power double-quantum cross polarization under fast magic angle spinning with the Carr-Purcell-Meiboom-Gill scheme shows selective detection of protonated sites with low-power radio-frequency irradiation. NMR shift calculations of a series of N-containing molecules and a graphene nanoflake model were performed to help interpreting the experimental data. This work demonstrates a powerful approach to identify and quantify the different nitrogen environments in doped graphene materials and can also be widely applied to similar graphitic carbon-based materials with other dopants.