• 文献标题:   Negative Thermal Expansion Coefficient of Graphene Measured by Raman Spectroscopy
  • 文献类型:   Article
  • 作  者:   YOON D, SON YW, CHEONG H
  • 作者关键词:   graphene, raman spectroscopy, thermal expansion coefficient, strain
  • 出版物名称:   NANO LETTERS
  • ISSN:   1530-6984
  • 通讯作者地址:   Sogang Univ
  • 被引频次:   466
  • DOI:   10.1021/nl201488g
  • 出版年:   2011

▎ 摘  要

The thermal expansion coefficient (TEC) of single-layer graphene is estimated with temperature-dependent Raman spectroscopy in the temperature range between 200 and 400 K. It is found to be strongly dependent on temperature but remains negative in the whole temperature range with a room temperature value of (-8.0 +/- 0.7) x 10(-6) K-1. The strain caused by the TEC mismatch between graphene and the substrate plays a crucial role in determining the physical properties of graphene, and hence its effect must be accounted for in the interpretation of experimental data taken at cryogenic or elevated temperatures.