• 文献标题:   Line defects guided molecular patterning on graphene
  • 文献类型:   Article
  • 作  者:   HUANG YJ, ZHU SZ, LI T
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951 EI 1077-3118
  • 通讯作者地址:   Univ Maryland
  • 被引频次:   4
  • DOI:   10.1063/1.4867534
  • 出版年:   2014

▎ 摘  要

Graphene emerges as a candidate scaffold for patterning molecules. Despite existing progresses, it still remains unclear how to achieve molecular self-assembly in domains of desirable geometry. We reveal a barrier effect of line defects (e.g., open slits) in graphene, which can potentially enable molecular confining and patterning in a domain of desirable geometry. Using molecular dynamics simulations, we demonstrate that fullerene molecules can be readily patterned into a stable cluster of various shapes and sizes. Such a strategy is expected to be applicable to pattern various types of molecules that interact with graphene via van der Waals force. (C) 2014 AIP Publishing LLC.