• 文献标题:   Nanoscale Control of Rewriteable Doping Patterns in Pristine Graphene/Boron Nitride Heterostructures
  • 文献类型:   Article
  • 作  者:   VELASCO J, JU L, WONG D, KAHN S, LEE J, TSAI HZ, GERMANY C, WICKENBURG S, LU J, TANIGUCHI T, WATANABE K, ZETTL A, WANG F, CROMMIE MF
  • 作者关键词:   graphene/boron nitride heterostructure, scanning tunneling microscopy, pn junction, boron nitride defect
  • 出版物名称:   NANO LETTERS
  • ISSN:   1530-6984 EI 1530-6992
  • 通讯作者地址:   Univ Calif Berkeley
  • 被引频次:   25
  • DOI:   10.1021/acs.nanolett.5b04441
  • 出版年:   2016

▎ 摘  要

Nanoscale control of charge doping in two-dimensional (2D) materials permits the realization of electronic analogs of optical phenomena, relativistic physics at low energies, and technologically promising nanoelectronics. Electrostatic gating and chemical doping are the two most common methods to achieve local control of such doping. However, these approaches suffer from complicated fabrication processes that introduce contamination, change material properties irreversibly, and lack flexible pattern control. Here we demonstrate a clean, simple, and reversible technique that permits writing, reading, and erasing of doping patterns for 2D materials at the milometer scale. We accomplish this by employing a graphene/boron nitride heterostructure that is equipped with a bottom gate electrode. By using electron transport and scanning tunneling microscopy (STM), we demonstrate that spatial control of charge doping can be realized with the application of either light or STM tip voltage excitations in conjunction with a gate electric field. Our straightforward and novel technique provides a new path toward on-demand graphene p-n junctions and ultrathin memory devices.