▎ 摘　　要

The growing research interest and uptake of layered nanomaterials for real-world applications require efficient, reliable, high-quality characterization methods. Liquid-exfoliated graphene has well-established Raman spectroscopic metrics for mean size and thickness. In association with the mapping process described here, distributions of nanosheet properties can be reconstructed. Here, we develop new, robust metrics for length and layer number of MoS2 nanosheets, developed using resonant Raman spectroscopy, applicable to both liquid- and mechanically-exfoliated MoS2. The use of metricized Raman mapping analysis, here demonstrated for graphene and MoS2, facilitates the standardization of characterization, allowing the correlation of size- and thickness-sensitive applications' performance with materials properties.