• 文献标题:   Electronic transport and shot noise in Thue-Morse sequence graphene superlattice
  • 文献类型:   Article
  • 作  者:   HUANG HP, LIU D, ZHANG HM, KONG XJ
  • 作者关键词:  
  • 出版物名称:   JOURNAL OF APPLIED PHYSICS
  • ISSN:   0021-8979 EI 1089-7550
  • 通讯作者地址:   Hebei Normal Univ
  • 被引频次:   18
  • DOI:   10.1063/1.4788676
  • 出版年:   2013

▎ 摘  要

The transport properties and shot noise in Thue-Morse (TM) sequence graphene superlattice are investigated using transfer matrix methods. The results indicate perfect transport with T = 1 is always obtained at normal incidence when incident electrons tunnel through different barrier widths and heights. The zero-(k) over bar -gap and other Bragg gap exhibit different behavior as the barrier width or incident angle increases. Furthermore, the changing of the structure parameters and generation of the TM sequence has a great effect on transmission coefficient, conductance, and Fano factor. It is shown that the Fano factor has a maximum close to 1/3 in the vicinity of Dirac point, which result in robust electronic transport properties. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4788676]