• 文献标题:   Valley polarized electronic transport through a line defect in graphene: An analytical approach based on tight-binding model
  • 文献类型:   Article
  • 作  者:   JIANG LW, LV XL, ZHENG YS
  • 作者关键词:   valley polarization, line defect, graphene
  • 出版物名称:   PHYSICS LETTERS A
  • ISSN:   0375-9601
  • 通讯作者地址:   Jilin Univ
  • 被引频次:   14
  • DOI:   10.1016/j.physleta.2011.10.043
  • 出版年:   2011

▎ 摘  要

We develop a tight-binding theory to study the electronic transport through an extended line defect in monolayer graphene. After establishing an analytical expression of the transmission probability, we clarify the following issues concerning the valley polarization in the electronic transport process. Firstly, we find that the valley polarization is robust in the total linear dispersion region. More interestingly, we find that the lattice deformation around the line defect play an important role in tuning the incident angle for complete transmission. Finally, we indicate that next nearest neighbor interaction only causes a small suppression to the valley polarization. (C) 2011 Elsevier B.V. All rights reserved.