▎ 摘　　要

This paper presents the simultaneous topographical and tip-enhanced Raman imaging of single layer and multilayer graphene flakes. The probe tips suitable for tapping mode atomic force microscopy (AFM) and tip-enhanced Raman spectroscopy have been fabricated by flattening Au microwires. The flattened part of the probe provides a flexible cantilever suitable to work in a tapping mode as a force sensor and the electrochemically etched tip works as an optical antenna. The enhancement up to 10(6) of the D and G band of graphene has been observed while control of the tip sample pressure produced the shift in G band wavelength. The peak fluctuation in the 2D band also suggests the local stress distribution produced due to graphene-tip interaction. The number of layers and stress analysis in 2-D imaging allows nondestructive identification of graphene layers critical for the evaluation of this material in future device applications. (C) 2011 Elsevier B.V. All rights reserved.