• 文献标题:   Novel gold cantilever for nano-Raman spectroscopy of graphene
  • 文献类型:   Article
  • 作  者:   SNITKA V, RODRIGUES RD, LENDRAITIS V
  • 作者关键词:   graphene, tipenhanced, nanoraman, atomic force microscopy
  • 出版物名称:   MICROELECTRONIC ENGINEERING
  • ISSN:   0167-9317 EI 1873-5568
  • 通讯作者地址:   Kaunas Univ Technol
  • 被引频次:   42
  • DOI:   10.1016/j.mee.2011.02.046
  • 出版年:   2011

▎ 摘  要

This paper presents the simultaneous topographical and tip-enhanced Raman imaging of single layer and multilayer graphene flakes. The probe tips suitable for tapping mode atomic force microscopy (AFM) and tip-enhanced Raman spectroscopy have been fabricated by flattening Au microwires. The flattened part of the probe provides a flexible cantilever suitable to work in a tapping mode as a force sensor and the electrochemically etched tip works as an optical antenna. The enhancement up to 10(6) of the D and G band of graphene has been observed while control of the tip sample pressure produced the shift in G band wavelength. The peak fluctuation in the 2D band also suggests the local stress distribution produced due to graphene-tip interaction. The number of layers and stress analysis in 2-D imaging allows nondestructive identification of graphene layers critical for the evaluation of this material in future device applications. (C) 2011 Elsevier B.V. All rights reserved.