• 文献标题:   Graphene coated cotton nonwoven for electroconductive and UV protection applications
  • 文献类型:   Article
  • 作  者:   JAIN VK, CHATTERJEE A
  • 作者关键词:   electrical resistivity, cotton nonwoven, graphene oxide mass loading, ultraviolet protective factor
  • 出版物名称:   JOURNAL OF INDUSTRIAL TEXTILES
  • ISSN:   1528-0837 EI 1530-8057
  • 通讯作者地址:  
  • 被引频次:   1
  • DOI:   10.1177/15280837211059202 EA DEC 2021
  • 出版年:   2022

▎ 摘  要

The functional properties and applications of graphene coated textiles depend on the magnitude of graphene add-on which in turn is influenced by the type of substrate and the dipping conditions. In the present study, optimized GO (graphene oxide) dipping conditions are identified for the preparation of cost-effective and scalable rGO (reduced graphene oxide) coated cotton nonwoven for electroconductive and UV (ultraviolet) blocking applications. To understand the influence of GO dipping variables on rGO add-on and electrical resistivity of cotton, batch adsorption studies are carried out in loose fibre form to eliminate the structural influence of yarn or fabric. Batch adsorption studies suggest that GO concentration, pH of GO solution and sodium dithionite (reductant) concentration are the most influencing dipping variables and these dipping variables are optimized for cotton nonwoven fabric using Box-Behnken response surface design to achieve minimum surface resistivity. The rGO coated cotton nonwoven fabric shows excellent UV blocking properties (UV protection factor = 89.38) at the optimized GO dipping conditions. Physical properties of cotton nonwoven fabric such as GSM, thickness, stiffness, breaking strength and elongation are analysed at different dipping cycles. After the rGO coating, bending rigidity, bending modulus and breaking elongation of the cotton nonwoven fabric decrease, whereas the breaking strength increases. rGO coated cotton fabric exhibits excellent stability towards multiple washing and rubbing. The graphene coated cotton is characterised by FT-IR, XRD, Raman, TGA, FESEM and LEICA image analyser.