• 文献标题:   Polariton enhanced infrared reflection of epitaxial graphene
  • 文献类型:   Article
  • 作  者:   DAAS BK, DANIELS KM, SUDARSHAN TS, CHANDRASHEKHAR MVS
  • 作者关键词:  
  • 出版物名称:   JOURNAL OF APPLIED PHYSICS
  • ISSN:   0148-6055 EI 1520-8516
  • 通讯作者地址:   Univ S Carolina
  • 被引频次:   19
  • DOI:   10.1063/1.3666069
  • 出版年:   2011

▎ 摘  要

We show SiC substrate phonon-induced surface plasmon polariton (SPP) formation in epitaxial graphene grown on 4H-SiC, in SiC's restrahlen band (8-10 mu m). By fitting measurement to theory, we extract thickness, momentum scattering time (tau), sheet carrier density (n(s)), and estimate carrier mobility. By showing that tau proportional to 1 root n(s), we argue that scattering is dominated by short-range interactions at the SiC/graphene interface. SPP formation finds application in nanophotonic devices for optical computing because of graphene's unique plasmonic properties. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3666069]