• 文献标题:   Determination of absolute number of graphene layers on nickel substrate with scanning Auger microprobe
  • 文献类型:   Article
  • 作  者:   SHIMA M, KATO H, SHIHOMMATSU K, HOMMA Y
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS EXPRESS
  • ISSN:   1882-0778 EI 1882-0786
  • 通讯作者地址:   JEOL Ltd
  • 被引频次:   1
  • DOI:   10.7567/1882-0786/ab5743
  • 出版年:   2020

▎ 摘  要

Graphene segregated on Ni surface is analyzed using scanning Auger electron spectroscopy. Spectral analysis of the energy-filtered image of reflected electrons shows two main features, namely a zero-loss peak intensity that monotonically decreases with increasing number of graphene layers, and an intensity ratio of the ???* transition peak to the zero-loss peak that monotonically increases with increasing number of graphene layers. These features can be used to determine the absolute number of graphene layers in a nanoscale region without the effect of channeling from crystal faces.