• 文献标题:   Exploring carrier transport phenomena in a CVD-assembled graphene FET on hexagonal boron nitride
  • 文献类型:   Article
  • 作  者:   KIM E, JAIN N, JACOBSGEDRIM R, XU Y, YU B
  • 作者关键词:  
  • 出版物名称:   NANOTECHNOLOGY
  • ISSN:   0957-4484
  • 通讯作者地址:   SUNY Albany
  • 被引频次:   26
  • DOI:   10.1088/0957-4484/23/12/125706
  • 出版年:   2012

▎ 摘  要

The supporting substrate plays a crucial role in preserving the superb electrical characteristics of an atomically thin 2D carbon system. We explore carrier transport behavior in a chemical-vapor-deposition- (CVD-) assembled graphene monolayer on hexagonal boron nitride (h-BN) substrate. Graphene-channel field-effect transistors (GFETs) were fabricated on ultra-thin h-BN multilayers to screen out carrier scattering from the underlying SiO2 substrate. To explore the transport phenomena, we use three different approaches to extract carrier mobility, namely, effective carrier mobility (mu(eff)), intrinsic carrier mobility (mu), and field-effect mobility (mu FE). A comparative study has been conducted based on the electrical characterization results, uncovering the impacts of supporting substrate material and device geometry scaling on carrier mobility in GFETs with CVD-assembled graphene as the active channel.