▎ 摘　　要

Aluminum (0.5 at.%)-doped ZnO (AZO) thin films were deposited by pulsed laser deposition technique (PLD) in oxygen ambient of 10(-6) Torr. The deposited thin films were characterized by x-ray diffraction (XRD), photoluminescence (PL), Raman spectroscopy and uv-visible spectroscopy (UV-vis). Next, graphene oxide (GO) was synthesized by Hummers method and was characterized by XRD, UV-vis spectroscopy, Raman spectroscopy and transmission electron microscopy (TEM). Thereafter, GO solution was drop-casted on AZO thin films. These films were then characterized by Raman Spectroscopy, UV{vis spectroscopy and PL. Attempt is being made to comprehend the modifications in properties brought about by integration.