• 文献标题:   Reduced junction temperature and enhanced performance of high power light-emitting diodes using reduced graphene oxide pattern
  • 文献类型:   Article
  • 作  者:   HAN N, JUNG E, HAN M, RYU BD, KO KB, PARK YJ, CUONG T, CHO J, KIM H, HONG CH
  • 作者关键词:   graphene oxide, light emitting diode, heat dissipation, iiiv semiconductor, temperature measurement
  • 出版物名称:   JOURNAL OF PHYSICS DAPPLIED PHYSICS
  • ISSN:   0022-3727 EI 1361-6463
  • 通讯作者地址:   Pohang Univ Sci Technol POSTECH
  • 被引频次:   4
  • DOI:   10.1088/0022-3727/48/26/265102
  • 出版年:   2015

▎ 摘  要

Thermal management has become a crucial area for further development of high-power light-emitting didoes (LEDs) due to the high operating current densities that are required and result in additional joule heating. This increased joule heating negatively affects the performance of the LEDs since it greatly decreases both the optical performance and the lifetime. To circumvent this problem, a reduced graphene oxide (rGO) layer can be inserted to act as a heat spreader. In this study, current-voltage and light-output-current measurements are systematically performed at different temperatures from 30 to 190 degrees C to investigate the effect that the embedded rGO pattern has on the device performance. At a high temperature and high operating current, the junction temperature (T-j) is 23% lower and the external quantum efficiency (EQE) is 24% higher for the rGO embedded LEDs relative to those of conventional LEDs. In addition, the thermal activation energy of the rGO embedded LEDs exhibits a 30% enhancement as a function of the temperature at a bias of -5V. This indicates that the rGO pattern plays an essential role in decreasing the junction temperature and results in a favorable performance in terms of the temperature of the high power GaN-based LED junction.