• 文献标题:   Line width dependence of transport properties in graphene nanoribbon interconnects with real space edge roughness determined by Monte Carlo method
  • 文献类型:   Article
  • 作  者:   MISAWA T, OKANAGA T, MOHAMAD A, SAKAI T, AWANO Y
  • 作者关键词:  
  • 出版物名称:   JAPANESE JOURNAL OF APPLIED PHYSICS
  • ISSN:   0021-4922 EI 1347-4065
  • 通讯作者地址:   Keio Univ
  • 被引频次:   4
  • DOI:   10.7567/JJAP.54.05EB01
  • 出版年:   2015

▎ 摘  要

We developed a novel Monte Carlo simulation model to investigate the line width dependence of the transport properties of multi-layered graphene nanoribbon (GNR) interconnects with edge roughness. We reported that the line width dependence of carrier mobility decreases significantly as the magnitude of the edge roughness gets smaller, which agrees well with experiments. We also discussed the influence of the inelasticity of edge roughness scatterings, inter-layer tunneling, and line width dependent band structures on the line width of the GNR interconnects. (C) 2015 The Japan Society of Applied Physics