• 文献标题:   Novel multi-bit memory device using metal/PVDF-TrFE/graphene stack
  • 文献类型:   Article
  • 作  者:   HWANG HJ, YANG JH, KANG SC, CHO C, KANG CG, LEE YG, LEE BH
  • 作者关键词:   graphene, ferroelectric, mfg stack, multibit memory
  • 出版物名称:   MICROELECTRONIC ENGINEERING
  • ISSN:   0167-9317 EI 1873-5568
  • 通讯作者地址:   Gwangju Inst Sci Technol
  • 被引频次:   8
  • DOI:   10.1016/j.mee.2013.02.094
  • 出版年:   2013

▎ 摘  要

Novel multi-bit memory device using a graphene/a ferroelectric polymer stack has been successfully demonstrated. The dual top gate electrodes are used to change the Fermi level of graphene by polarizing PVDF-TrFE layer. Two different polarization states in the same graphene channel generate four states of junction combinations, resulting in four channel resistance values. Four different states are maintained up to 1000 s and 100 cycles of endurance has been confirmed. This device can be utilized in high performance memory device with high bit density per memory cell since the response time of ferroelectric polymer is faster than 10 ns. Published by Elsevier B.V.